1.
High Frequency Power Amplifier Basics
Also show non-linearity – despite the name. Power amplifier. Linear PA: Class. A/AB/B/C. Switching PA: Class. D/E/F and derivates. • Operate power device in ...
2.
Simulation of a Digital Neuro-Chip for Spiking Neural Networks
N e u r o n - U n i t. N e t - P a r . -. M e m o r y. W e i g h t ... Converter. From the Propagate-Stage a copy of the DP is also delivered to a ...
3.
An Asynchronous up/down Counter for Control of a Self-timed, Wave ...
File Format: Adobe PostScript tional circuits: a FIFO and an asynchronous up/down counter. The FIFO at the bottom of the array multiplier is used for buffering the calculated values if ...
4.
Seminar: Moderne Methoden der analogen Schaltungstechnik
File Format: PDF/Adobe Acrobat - View as HTML Seminar: Moderne Methoden der analogen Schaltungstechnik. Teil 4. Eugenio Di Gioia. Page 2. 2. Compensation of feedback amplifiers. Page 3. 3. Summary ...
5.
High Frequency Power Amplifier Basics
Power Transistor Load Condition. • Classical linear RF/microwave amplifier design: “Device under test” (DUT) described by S parameters at design frequency ...
6.
Simulation of Spiking Neural Networks on Different Hardware Platforms
File Format: PDF/Adobe Acrobat - View as HTML on Different Hardware Platforms. A. Jahnke, T. Schönauer, U. Roth, K. Mohraz and H.Klar. Institut für Mikroelektronik, Technische Universität Berlin ...
7.
An Asynchronous up/down Counter for Control of a Self-timed, Wave ...
File Format: Adobe PostScript tional circuits: a FIFO and an asynchronous up/down counter. The FIFO at the bottom of the array multiplier is used for buffering the calculated values if ...
8.
Focused Ion Beam (FIB) Applications
File Format: PDF/Adobe Acrobat - View as HTML Through-Silicon FIB Editing of ICs. • Device & Circuit edit. • Deposition of Probing Pads for. Single Device Characterization. FIB modification ...
9.
Technology
surface scan set-ups, Tencor Alphastep 200 u. Sloan Dektak IIA # Vierspitzenmeßplatz ... ultrasonic drill, KLN Ultraschall GmbH 430/901 ...
10.
Publications
ISTFA 2005, Santa Clara CA, USA, Proceedings of the 31st International Symposium for Testing and Failure Analysis, pp64-69 (2005) ...